Judging From Support-Set: A New Way To Utilize Few-Shot Segmentation For Segmentation Refinement Process
Moon, Seonghyeon Liu, Qingze Tony Kong, Haein Khan, Muhammad Haris
Moon, Seonghyeon
Liu, Qingze Tony
Kong, Haein
Khan, Muhammad Haris
Supervisor
Department
Computer Vision
Embargo End Date
Type
Conference proceeding
Date
2025
License
Language
English
Collections
Research Projects
Organizational Units
Journal Issue
Abstract
Segmentation refinement enhances coarse masks generated by segmentation algorithms, aiming for detailed and accurate contours of target objects. Despite advancements in segmentation refinement research, no method exists to evaluate its success, which is critical for reliable applications. To address this gap, we propose Judging From Support-set (JFS), leveraging a few-shot segmentation (FSS) model in a novel evaluation pipeline. Traditional FSS aims to locate target objects in query images using support set information. In JFS, coarse and refined masks from segmentation refinement methods become support masks for the FSS model, with the existing support mask serving as the test set. This setup evaluates the quality of refined segmentation. We validate JFS using the SAM Enhanced Pseudo-Labels (SEPL) and SegGPT on the PASCAL dataset, demonstrating its potential to reliably judge segmentation refinement success and foster innovation in image processing.
Citation
S. Moon, Q. T. Liu, H. Kong and M. H. Khan, "Judging From Support-Set: A New Way To Utilize Few-Shot Segmentation For Segmentation Refinement Process," 2025 IEEE International Conference on Image Processing (ICIP), Anchorage, AK, USA, 2025, pp. 1-6, doi: 10.1109/ICIP55913.2025.11084668
Source
Proceedings of IEEE International Conference on Image Processing
Conference
2025 IEEE International Conference on Image Processing (ICIP)
Keywords
Segmentation Refinement, Few-Shot Segmentation, Object Segmentation
Subjects
Source
2025 IEEE International Conference on Image Processing (ICIP)
Publisher
IEEE