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Test-Time Low Rank Adaptation via Confidence Maximization for Zero-Shot Generalization of Vision-Language Models

Imam, Raza
Gani, Hanan
Huzaifa, Muhammad
Nandakumar, Karthik
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Computer Vision
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Conference proceeding
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2025
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English
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Abstract
The conventional modus operandi for adapting pre-trained vision-language models (VLMs) during test-time involves tuning learnable prompts, i.e., test-time prompt tuning. This paper introduces Test-Time Low-rank adaptation (TTL) as an alternative to prompt tuning for zero-shot generalization of large-scale VLMs. Taking inspiration from recent advancements in efficiently fine-tuning large language models, TTL offers a test-time parameter-efficient adaptation approach that updates the attention weights of the transformer encoder by maximizing prediction confidence. The self-supervised confidence maximization objective is specified using a weighted entropy loss that enforces consistency among predictions of augmented samples. TTL introduces only a small amount of trainable parameters for low-rank adapters in the model space while keeping the prompts and backbone frozen. Extensive experiments on a variety of natural distribution and cross-domain tasks show that TTL can outperform other techniques for test-time optimization of VLMs in strict zero-shot settings. Specifically, TTL outperforms test-time prompt tuning baselines with a significant improvement on average. Our code is available at https://github.com/Razaimam45/TTLTest-Time-Low-Rank-Adaptation
Citation
R. Imam, H. Gani, M. Huzaifa and K. Nandakumar, "Test-Time Low Rank Adaptation via Confidence Maximization for Zero-Shot Generalization of Vision-Language Models," 2025 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), Tucson, AZ, USA, 2025, pp. 5449-5459, doi: 10.1109/WACV61041.2025.00532.
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Proceedings - 2025 IEEE Winter Conference on Applications of Computer Vision, WACV 2025
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2025 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2025
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2025 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2025
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IEEE
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